Crystal Impact Match v1.9a

Match! Function List

* Fast single and multiple phase identification from powder diffraction data
* Use free-of-charge reference patterns calculated from the IUCr/ COD/AMCSD (incl. I/Ic), any ICSD/Retrieve version (released 1993-2002; valid licence required), any ICDD PDF database and/or your own diffraction data (or patterns calculated from crystal structure data (e.g. CIF files)) in phase identification
* Flexible handling of reference databases (incl. user databases); you can easily switch between different reference databases without the necessity to perform a new database indexation
* Create reference databases for neutron diffraction e.g. from cif-files
* Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
* Powerful CIF- and ICSD/Retrieve import, incl. calculation of powder pattern, I/Ic and density
* Atomic coordinates available e.g. in the ICSD, the ICDD PDF-4+ or free-of-charge reference data are displayed in the data sheets and included in the CIF exports (e.g. for Rietveld analysis)
* View crystal structures in Diamond with just a few clicks
* Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
* Automatic residual searching with respect to identified phases
* Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
* Automatic optimization of peak searching sensitivity
* Fitting of all (or selected) peak parameters to exp. profile data
* Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
* Semi-quantitative analysis (Reference Intensity Ratio method)
* Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
* Integrated database retrieval system and viewer for PDF and user datasheets
* Multiple step undo/redo
* Support for new PDF entry numbers (9 digits)
* User-configurable automatic operation
* Full parameter control with instant rearrangement of the results list
* Automatic d-value shifting during search-match process (optionally)
* Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
* Comfortable graphical and tabular comparison of peak data and candidate patterns
* Mouse-controlled pattern graphics zooming and tracking
* User-configurable HTML-reports
* Online update (automatic or manual)
* Supported diffraction data file formats (automatic detection):
o ASCII profile (start, step, intensities or 2 columns)
o Bruker/Siemens raw data (old and new) (*.raw)
o Bruker/Siemens DIFFRAC AT peak data (*.dif)
o DBWS (*.rfl, *.dat)
o ENDEAVOUR peak list (2 columns: 2theta/d intensity; *.dif)
o Inel raw data (*.dat)
o Jade/MDI/SCINTAG raw data (*.mdi)
o JEOL ASCII Export raw data (*.txt)
o PANalytical XRDML Scan raw data (*.xrdml)
o PANalytical/Philips peak data (*.udi)
o PANalytical/Philips raw data (*.rd, *.udf)
o Rigaku raw data (*.raw)
o SCINTAG raw data (*.raw, *.rd)
o Shimadzu raw data (*.raw)
o Siemens (*.uxd)
o Stoe raw data (*.raw)
o Stoe peak data (*.pks)